Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method

Status

Rate

Check Later

Details

First publish year 1997

Authors

Massood Tabib-Azar

Massood Tabib-Azar

Subjects

Crystal Defects Silicon Carbides Diffusion Length Minority Carriers

Reviews (0) see more

Seems like you haven't provided a review

Don't miss the opportunity to share your thoughts!

Similar Books

Similar Movies

Similar TV Series

Similar Games