Proceedings of the Symposium on Reliability of Metals in Electronics

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First publish year 1995

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Symposium on Reliability of Metals in Electronics (1995 Reno, Nev.)

Symposium on Reliability of Metals in Electronics (1995 Reno, Nev.)

Subjects

Electric Properties Metallic Films Reliability Breakdown (Electricity) Thin Film Devices Congresses Semiconductors Electrodiffusion

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